OKANO, S.; TAMURA, Y.; YAMADA, S. Sensitivity Analysis Considering Wiener Processes and Deep Learning for OSS Reliability Assessment. Journal of Graphic Era University, [S. l.], v. 14, n. 01, p. 35–52, 2025. DOI: 10.13052/jgeu0975-1416.1412. Disponível em: https://www.journal.riverpublishers.com/index.php/JGEU/article/view/444. Acesso em: 25 oct. 2025.